Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

A persistent problem in scanning electron microscopy is the deposition of hydrocarbon contamination induced by an electron beam. Generally, the deposition of contamination on a specimen is a negative ...

High-magnification of tooth enamel in normal (control) mice (left) and mice with ORAI1 gene mutation (right) by scanning electron microscope. Disclaimer: AAAS and EurekAlert! are not responsible for ...