Advances in deep learning have transformed the field of infrastructure maintenance, particularly in the automated detection and characterisation of defects in sewer pipelines. Leveraging large volumes ...

A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...