Eddy current testing is a well-established method of nondestructive testing that is used to examine nonferrous/nonmagnetic materials such as condenser and heat exchanger tubes in power generation ...
Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
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Cutting-edge imaging and faster algorithms for finding minuscule defects in semiconductor chips
A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...
Time-domain reflectometry (TDR) that employs electro-optical sampling affords excellent resolution at the femtosecond level and exhibits a comprehensible impulse waveform, thereby allowing quick ...
A joint research team led by Dr. Hee-Eun Song of the Photovoltaics Research Department at the Korea Institute of Energy Research (President Yi Chang-Keun, hereafter “KIER”) and Prof. Ka-Hyun Kim of ...
To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting ...
SPONSORED: Quality control and efficient O&M of rooftop commercial PV installations are economic and technical challenges, but essential nonetheless. The key objective in conducting O&M is to ensure ...
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